RF isolation test device having ease of accessibility

ABSTRACT

A radio frequency (RF) isolation test device providing versatility and flexibility, along with RF shielding, in the testing of various types of devices. The RF isolation test device provides for ease of accessibility by having a pivoting handle which locks the test device closed and provides for quickly opening of the test device, also assisted through gas springs.

REFERENCE TO RELATED APPLICATIONS

The present application is related to the following applications, all ofwhich are incorporated herein by reference as if fully set forth: UnitedStates patent application of Russell S. Krajec, entitled “AdjustableElectrical Connector for Test Fixture Nest,” and filed Nov. 17, 1999;United States patent application of Russell S. Krajec and Wallace J.Lannen, entitled “Signal Transfer Device for Probe Test Fixture,” andfiled Nov. 17, 1999; United States patent application of Russell S.Krajec, John L. Bidwell, and William R. Miner, entitled “CustomizableNest for Positioning a Device Under Test,” and filed Jan. 18, 2000;United States patent application of Bryan D. Boswell, John L. Bidwell,and Russell S. Krajec, entitled “RF Isolation Test Device Having a BoxWithin a Box Configuration for RF Shielding and a Low Resonance TestEnvironment,” and filed on even date herewith; United States patentapplication of Bryan D. Boswell, John L. Bidwell, and Russell S. Krajec,entitled “RF Isolation Test Device Accommodating Multiple Nest Platesfor Testing Different Devices and Providing Variable Testing Options,”and filed on even date herewith; United States patent application ofRick T. Euker, entitled “Customizable Nest That Requires No Machining orTools,” and filed on even date herewith; United States patentapplication of Rick T. Euker, entitled “Customizable Nest Providing forAdjustable Audio Isolation for Testing Wireless Devices,” and filed oneven date herewith; and United States patent application of Rick T.Euker, entitled “Customizable Nest With the Option of Conversion to aPermanent Nest,” and filed on even date herewith.

FIELD OF THE INVENTION

The present of invention relates to an apparatus for testing devicesrequiring shielding from radio frequency (RF) energy.

BACKGROUND OF THE INVENTION

Testing of certain devices such as cellular telephones requiresshielding of the devices from ambient RF energy. The shielding isrequired to both ensure that external RF energy does not interfere withthe device under test, and also to ensure that the device being testeddoes not generate RF energy that interferes with other devices. Certaindevices exist for such testing, and they include, for example, devicesfor automatic testing on an assembly line. These devices typicallyinclude a robotic arm that loads the device under test into a testingdrawer that provides RF shielding and, upon completion of the test,automatically removes the device from the testing drawer and replaces itback onto the assembly line. These automatic testing devices, however,do not have portability and thus cannot be easily moved from one site toanother for testing.

Certain portable testing devices do exist for testing of RF devices.However, these testing devices typically do not have ease ofaccessibility for the testing, and usually do not have options fordifferent types of testing or for use with different types of devicesunder test. Therefore, these testing devices must be custom made foreach device to be tested. Accordingly, a need exists for an RF isolationtest device having more versatility and flexibility in the options thatit provides for testing.

SUMMARY OF THE INVENTION

An RF isolation test device consistent with the present inventionincludes an upper outer enclosure and a lower outer enclosure matingwith the upper outer enclosure. The upper and lower outer enclosuresprovide for RF shielding of a device under test located within the testdevice when they are mated together. An open-close mechanism permits theupper and lower outer enclosures to open for access within the testdevice and to close for testing of the device under test, and theopen-close mechanism includes an assist mechanism that assists a user inopening and closing the test device.

Another RF isolation test device consistent with the present inventionincludes an upper outer enclosure and a lower outer enclosure matingwith the upper outer enclosure. The upper and lower outer enclosuresprovide for RF shielding of a device under test located within the testdevice when they are mated together. The test device also includes ahandle and a corresponding locking element, operably attached to theupper and lower outer enclosures, for use in opening the upper and lowerouter enclosures and for locking them closed in order to test the deviceunder test located within the test device.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings are incorporated in and constitute a part ofthis specification and, together with the description, explain theadvantages and principles of the invention. In the drawings,

FIG. 1 is a perspective view of an RF isolation test device;

FIG. 2 is a front view of the RF isolation test device;

FIG. 3 is a side view of the RF isolation test device;

FIG. 4 is a rear view of the RF isolation test device;

FIG. 5 is a top view of the RF isolation test device;

FIG. 6 is a bottom view of the RF isolation test device;

FIG. 7 is a perspective view of the RF isolation test device, showingthe test device open;

FIG. 8 is a perspective view of the RF isolation test device with anupper outer enclosure removed;

FIG. 9 is a perspective view of an inner enclosure for the RF isolationtest device;

FIG. 10 is a perspective view of the inner enclosure with a front plateremoved;

FIG. 11 is rear view of the inner enclosure;

FIG. 12 is a perspective view of a portion of the upper outer enclosure,and the inner enclosure;

FIG. 13 is a perspective view of a lower outer enclosure for the RFisolation test device and including a lower inner enclosure; and

FIG. 14 is a perspective view of the lower outer enclosure.

DETAILED DESCRIPTION Overview

An RF isolation test device, also referred to as “test device,”consistent with the present invention provides for versatility andvarious options in testing of a device under test. It provides forportability and ease of accessibility for rapid and easy testing ofdevices at a various locations. Also, it provides for shielding of adevice under test from ambient RF electromagnetic energy, and preventingRF electromagnetic energy from the device under test from interferingwith other devices.

A device under test used within the test device can include any type ofdevice requiring or benefitting from shielding from RF energy. Examplesinclude wireless devices such as cellular telephones, pagers, satellitetelephones, and Internet appliances. The RF shielding provides for a lowresonance test environment, and it thus helps to approximate idealtesting conditions simulating energy-free space. The test device usesmetallic components and structure for the RF shielding, and it providesfor electrical connection to the device under test while being tested.The test device may also provide for interfacing a manufacturing lineand control of automation such as pneumatic actuators.

Test devices consistent with the present invention, as further explainedbelow, implement features to provide for this RF shielding, lowresonance test environment, ease of use, and various testing options.One test device consistent with the present invention provides for easeof accessibility when testing devices. It includes an upper outerenclosure and a lower outer enclosure mating with the upper outerenclosure. The upper and lower outer enclosures provide for RF shieldingof a device under test located within the test device when they aremated together. The test device also includes an open-close mechanismpermitting the upper and lower outer enclosures to open for accesswithin the test device and to close for testing of the device undertest. The open-close mechanism can include an assist mechanism thatassists a user in opening and closing the test device. The open-closemechanism can include a handle and a corresponding locking element,operably attached to the upper and lower outer enclosures, for use inopening them and locking them closed in order to test the device undertest located within the test device.

Another test device consistent with the present invention has a “boxwithin a box” configuration for different types of RF shielding. Itincludes a first enclosure for primary shielding of the device undertest. The first enclosure includes an upper outer enclosure and a lowerouter enclosure mating with the upper outer enclosure. The upper andlower outer enclosures provide for RF shielding of a device under testlocated within the test device when they are mated together. The testdevice also includes a second enclosure, within the first enclosure, forproviding additional secondary RF shielding of the device under test andRF absorption to create a low resonance test environment. The secondenclosure includes an upper inner enclosure and a lower inner enclosuremating with the upper inner enclosure when they are closed together.

Another test device having a “box within a box” configuration includes afirst enclosure and a second enclosure located within the firstenclosure. The first enclosure has at least two enclosures opening toprovide access to the second enclosure and closing to shielding thedevice under test. The second enclosure also has at least two enclosuresopening to provide access to the second enclosure and the device undertest and closing to shielding the device under test.

Another test device consistent with the present invention provides forvarious testing options. It includes an upper outer enclosure and alower outer enclosure mating with the upper outer enclosure. The upperand lower outer enclosures provide for RF shielding of a device undertest located within the test device when they are mated together. Toprovide for testing options, the test device also includes a removableplate fastened to the lower outer enclosure. The removable plateincludes connections for access to the device under test when locatedwithin the test device.

Another test device having testing options can accommodate differenttypes of devices under test. It includes an upper outer enclosure and alower outer enclosure mating with the upper outer enclosure. The upperand lower outer enclosures provide for RF shielding of a device undertest located within the test device when they are mated together. Thetest device also includes a base plate for use in securing a removablenest plate within the test device to accommodate testing of variousconfigurations of the device under test. Nest plates may include, forexample, the nest plates described in the related applicationsidentified above.

The enclosures of the test device may include structures that fullyenclose or partially enclosure a device under test or other component,either alone or in combination. For example, the test device may includetwo enclosures that in combination fully enclose a device under test.Alternatively, the two enclosures may substantially enclose the deviceunder test, allowing for some nominal leakage of RF energy. Also, asidentified above, an enclosure may enclose the device under testdirectly, or enclose another enclosure for the “box within a box”configuration.

Outer Enclosure

FIG. 1 is a perspective diagram of a test device 10. Test device 10 isfurther illustrated in the various views shown in FIGS. 2-6. As shown inFIG. 1, and the other views in FIGS. 2-6, test device 10 includes twoouter enclosures, a lower outer enclosure 12 and an upper outerenclosure 14. Outer enclosures 12 and 14 are typically composed of ametallic material in order to provide for RF shielding. Examples ofmetallic materials for implementing metallic components of test device10 include aluminum, cast aluminum, and any other type of metalproviding RF shielding. Upper outer enclosure 14 in this exampleincludes two pieces, a cover 16 mounted on a portion 18. Cover 16 ismounted to portion 18 through a plurality of closely-spaced fasteners,such as screws, located within apertures on cover 16, such as aperture20. The number and spacing of the fasteners is such as to providesufficient force to ensure a good seal between cover 16 and portion 18of upper outer enclosure 14. Cover 16 may also be formed from a metallicmaterial. Use of a cast metallic material, for example, avoids seamsthat may otherwise allow leakage of RF energy.

Upper and lower outer enclosures 12 and 14 lock together through use ofa handle 36. Handle 36 is typically formed from a metallic material orany material with sufficient strength and durability for its function ofopening and closing test device 10. Handle 36 includes a handle bar 38to be grasped by a user for opening and closing test device 10. Handle36 also includes brackets 40 and 42 attached to handle bar 38. Brackets40 and 42 are mounted for rotation on upper outer enclosure 14 and, inparticular, on portion 18. For example, as shown, bracket 42 is mountedto a pivot point 44, and bracket 40 would likewise include a pivot pointon the opposite side of upper outer enclosure 14. Each bracket alsoincludes a hook, such as hook 46 for bracket 42. When test device 10 isin a closed position, each hook engages a cylindrical element protrudingfrom lower outer enclosure 12, such as a cylindrical element 48.Cylindrical element 48 protrudes a sufficient distance from the side oflower outer enclosure 12 to engage hook 46.

The cylindrical elements, shown as metal pins in this example,constitute locking elements. Cylindrical element 48, and a correspondingone on the other side of lower outer enclosure 12, engage the hooks onhandle 36 such that rotation of the hooks about the cylindrical elementscauses downward pressure on upper outer enclosure 14, locking it againstlower outer enclosure 12. The hooks in combination with the handleassembly provide the mechanical advantage to close upper outer enclosure14 to lower outer enclosure 12. The term “locking element” includes anyapparatus for locking closed a test device to prevent inadvertentopening of it or to provide an enclosure for RF shielding.

In order to open test device 10, handle 36 is moved in the directionshown by arrow 50, and in so doing hook 46 disengages cylindricalelement 48. When handle 36 disengages the cylindrical elements, upperouter enclosure 14 may pivot open through hinges on the back of upperand lower outer enclosures 14 and 12. In order to close test device 10,upper outer enclosure 14 is lowered and handled 36 is moved in thedirection shown by arrow 52 such that hook 46 engages cylindricalelement 48 and such that an identical hook on bracket 40 would engage acorresponding cylindrical element.

Therefore, handle 36 in combination with cylindrical element 48, andanother corresponding cylindrical element, constitutes an open-closemechanism for opening and closing test device 10 when moved,respectively, in directions 50 and 52. The term “open-close” mechanismincludes any apparatus for use in opening and closing a test device. Theuse of handle 36 for an open-close mechanism provides for ease ofaccessibility of test device 10 by permitting a user to open test device10 with one motion and close it with another. Furthermore, a user needonly use, for example, one hand grasping handle 36 on handle bar 38 toopen and close test device 10. This feature permits the user to haveanother hand free for placing a device under test within test device 10.A handle for implementing handle 36 may include alternative structuresand configurations; handle 36 is shown with brackets 40 and 42 having anangled shape in order to provide leverage to a user in opening andclosing test device 10.

To assist in the opening of test device 10, and to maintain the testdevice 10 open, test device 10 includes an assist mechanism. The term“assist mechanism” refers to any apparatus used to assist a user inopening a test device and potentially maintain it in an open position.In this example, test device 10 includes an assist mechanism through useof a pair of gas springs, such as gas spring 22. Gas spring 22 includestwo end portions 24 and 26. Those two end portions include a plasticreceptacle that snaps onto a metal ball protruding from elements 23 and25 in order to attach to, respectively, lower outer enclosure 12 andupper outer enclosure 14. Another gas spring 21, as shown in FIG. 2, ismounted in a similar manner. Gas springs 21 and 22 assist a user inopening test device 10 by applying pressure tending to force apart lowerouter enclosure 12 and upper outer enclosure 14. Also, the gas springsapply sufficient pressure to maintain test device 10 in a open positionwhen fully opened. This feature permits, for example, a user to haveboth hands free for placing a device under test in test device 10 or forperforming other work.

Lower outer enclosure 12 in this example also includes indented portions28, 29, 30, 32, and 34, and additional symmetrical indented portionshidden from view. As explained below, these indented portions providefor mounting points on the inside of lower outer enclosure 12. The term“indented portion” refers to any internal structure providing a mountingpoint for attaching a lower inner enclosure or other structure for usein testing, and the indented portions are sometimes referred to as a“stand-off.”

FIG. 2 is a front view of test device 10 further illustrating detail forhandle 36 and also showing the second gas spring 21. FIG. 3 is a sideview of test device 10 further illustrating detail of test device 10. Inparticular, the side view shows a hinge 54 on the back of the testdevice 10. The test device typically includes a pair of identical hingescomposed of any material with suitable strength and durability forpermitting upper and lower outer enclosures 12 and 14 to open and close.Hinge 54, for example, includes a lower element 56 and an upper element58. Lower element 56 is attached to a mounting portion 55 molded intolower outer enclosure 12 through screws or other fasteners. Likewise,upper element 58 is attached to a mounting portion 57 molded into upperouter enclosure 14 through screws or other fasteners.

The hinges allow for rotation of upper outer enclosure 14 when testdevice 10 is opened. Also, instead of using gas springs as an assistmechanism, test device 10 can use spring-loaded hinges for assisting theuser in opening test device 10 and maintaining it open. Thespring-loaded hinges can be used alone or in conjunction with the gassprings. Other types of assist mechanisms, mounted either external orinternal to test device 10, may also be used.

The side view in FIG. 3 also illustrates additional detail of hook 46engaging cylindrical element 48 protruding from upper outer enclosure14. In addition, this view further illustrates how handle 36 is mountedto pivot point 44 for rotational movement about pivot point 44.

As also shown in FIG. 3, connectors 60 on the back of test device 10provide for a connection to a device under test or testing apparatussuch as speakers and microphones, located within test device 10.Connectors 60 are further illustrated in the rear view shown in FIG. 4,and in this example connectors 60 include metal ports for passingelectrical connections to the inside of test device 10. Also, the rearview illustrates a transfer plate 62, typically composed of a metallicmaterial and mounted to the back of lower outer enclosure 12 through aplurality of closely-spaced screws or other fasteners, such as screws 59a, 59 b, 59 c, 59 d, 59 e, 59 f, 59 g, and 59 h. The number and spacingof the fasteners is such as to provide sufficient force to ensure a goodseal between transfer plate 62 and lower outer enclosure 12.

Transfer plate 62 in this example includes another connector 61 forconnection to a device under test or testing apparatus located withintest device 10. Use of transfer plate 62 provides the advantage ofversatility and flexibility in testing. In particular, different typesof transfer plates may exist for use with different types of connectionsfor various testing options. These transfer plates may be easilyinterchanged through removal of fasteners 59 a-59 h and mounting of adifferent plate onto lower outer enclosure 12.

The rear view shown in FIG. 4 also further illustrates attachment ofhinge 54 and another hinge 53 mounted in, for example, an identicalmanner. Different types of hinges, and more or fewer hinges, may be useddepending on a particular application.

FIG. 5 is a top view of test device 10 that further illustrates mountingof cover 16 and attachment of gas springs 21 and 22, and attachment ofhinges 53 and 54. FIG. 6 is a bottom view, which further illustratesindented portions 28, 29, 30, 32, and 34, and the indented portionshidden from view in FIG. 1. These indented portions are molded intolower outer enclosure 12. Lower outer enclosure 12 may include more orfewer such indented portions or not include any such portions.Therefore, outer enclosure can include a variable shape, meaning it doesnot necessarily have planar sides, in order to allow for molding of theindented portions to create mounting points, attachment of an open-closemechanism and an assist mechanism, attachment of the hinges, and othershapes or variations to allow for testing options.

Inner Enclosure

FIG. 7 is a view illustrating test device 10 when open. As shown, testdevice 10 includes an inner enclosure composed of a lower innerenclosure 66 and an upper inner enclosure 68. Therefore, as mentionedabove, test device 10 includes what is referred to as a “box within abox” configuration. The outer box is composed of lower outer enclosure12 and upper outer enclosure 14. The inner enclosure is composed oflower inner enclosure 66 and upper inner enclosure 68. The “box within abox” configuration provides for a low resonance test environment andmore effective RF shielding of a device under test.

Test device 10 also has what is referred to as a “clam shell” designwith halves that open and close about hinges 53 and 54. One half of theclam shell includes lower outer enclosure 12 and lower inner enclosure66. The other half includes upper outer enclosure 14 and upper innerenclosure 68. The use of the clam shell design permits the inner andouter enclosures to open wide about the hinges for ease of accessibilityto the interior of the inner enclosure where a device under test wouldbe located. This design also permits testing of larger products ordevices under test.

The device under test is located within the inner enclosure andtypically mounted on lower inner enclosure 66 through a use of a nestplate attached to lower inner enclosure 66. The inner enclosure providesfor isolating the device under test in an environment substantially freefrom external RF energy to provide a low resonance test environment. Inaddition, the inner enclosure helps to dampen RF energy from the deviceunder test and thus avoid interference caused by reflections of suchenergy within the testing environment. The outer enclosure provides forshielding of the device under test from external RF energy.

Both lower inner enclosure 66 and upper inner enclosure 68 of the innerenclosure include an external shielding material and an inner RFabsorption material. The shielding material in this example includes ametallic box that provides physical support for the RF absorptionmaterial and also provides conductivity to further absorb and conduct RFenergy. It can include any type of metallic material providing for RFshielding. The RF absorption material may include any material helpingto dampen RF energy from the device under test to avoid or reduceinterference from internal reflections of RF from the device under testand thus help to provide a non-reflective environment or a low resonancetest environment. This exemplary embodiment uses for the RF absorptionmaterial a neoprene material having ferrite trapezoids that function asa magnetic lossy absorber.

Unlike the variable shape of the outer enclosure, the inner enclosuremay include a regular configuration, meaning it has substantially planarsides. The regular shape of the shielding material of the innerenclosure provides a flat surface for ease of attaching the RFabsorption material. Also, the flat surfaces may provide for betterpredictability and dampening of RF reflections inside the innerenclosure by allowing uniform enclosure on all six sides. The innerenclosure may alternatively have a variable configuration, and the outerenclosure may alternatively have a regular configuration. However, useof variable and regular configurations for, respectively, the outer andinner enclosures may provide the advantages identified above.

Lower inner enclosure 66 includes a metallic plate 70 on which ismounted an absorption material 72. Also, lower inner enclosure 66 ismounted within lower outer enclosure 12. Upper inner enclosure 68 ismounted to upper outer enclosure 14 and includes a box with one sideopen, as shown, that meets with lower inner enclosure 66. Upper innerenclosure 68 includes an external metallic box 74 inside of which ismounted an RF absorption material 76. Upper inner enclosure 68 alsoincludes a front plate 78 mounted to brackets 83 and 84 through screws85, 86, 87, and 88, or other fasteners. Front plate 78 includes ametallic plate on which is mounted an RF absorption material 80 on itsinner surface facing inside upper inner enclosure 68.

Upper inner enclosure 68 need not necessarily include a removable frontplate 78. However, it may include such plate for additionalaccessibility to the device under test. Front plate 78 may have arectangular configuration, as shown, or other configurations dependingupon a particular implementation and desired access to the inside of theinner enclosure, although providing for uniform coverage of absorptionmaterial can be important for particular applications. Alternatively,upper inner enclosure 68 can have an integral front without a removablefront plate.

FIG. 8 is a perspective diagram providing additional detail of the innerenclosure by illustrating the RF isolation test device with upper outerenclosure 14 removed. As shown, upper inner enclosure 68 contacts orclosely contacts lower inner enclosure 66 when test device 10 is closed.On the top of upper inner enclosure 68 is a mounting bracket 92 forattaching upper inner enclosure 68 to upper outer enclosure 14. Bracket92 is mounted to upper inner enclosure 68 through screws 93, 94, 95, and96, or other fasteners. Bracket 92 may then be mounted to the inside ofupper outer enclosure 14 through fasteners within apertures 89, 97, 98,and 99. Bracket 92 may be formed from a metallic material.

Also, as shown is FIG. 8, lower outer enclosure 12 includes a channel91. Located within channel 91 is an RF gasket 90 that extends throughoutthe entire channel on the entire periphery of lower outer enclosure 12(see FIG. 7). RF gasket 90 is typically a wire mesh coil that providesfor electrical conductivity between lower outer enclosure 12 and upperouter enclosure 14 when closed together in order to simulate a weldedseam and provide for RF shielding. An RF gasket may include any type ofmetallic material providing conductivity between the enclosures forshielding.

FIG. 9 is a perspective diagram of the inner enclosure illustrating itcompletely removed from the outer enclosure. FIG. 10 is a perspectivediagram illustrating additional detail of the inner enclosure throughremoval of front plate 78. In use, the inner enclosure remains mountedwithin the outer enclosure, and it is shown removed to illustratedetails of it. As shown in FIG. 10, the entire interior of upper innerenclosure 68 typically includes RF absorption material 76 mounted on,for example, metallic plate 74. FIGS. 9 and 10 also illustrate fasteners106 and 108, including threaded portions 107 and 109, for attachinglower inner enclosure 66 to mounting points on the indented portions inlower outer enclosure 12.

FIG. 11 is a rear view of the inner enclosure illustrating additionaldetails of it. In particular, FIG. 11 illustrates how fasteners, such asfastener 108 is attached to plate 70 through a screw 115 attached to athreaded aperture 114. Fastener 108 also includes threaded portion 109for attachment to a threaded aperture in a mounting point within lowerouter enclosure 12.

Also shown in FIG. 11 is an aperture 103 in both the rear metallic plateand RF absorption material for passing electrical connections into theinner enclosure for testing of a device under test nested within it.FIG. 11 also illustrates a cable access hole 117 in both the rearmetallic plate and RF absorption material for routing electrical linessuch as speaker and microphone cables. This hole 117 allows routing ofcables from the inside of the inner enclosure to transfer plate 62. Inuse, the electrical connections pass through connectors 60, 61, or bothin transfer plate 62 and then through apertures 103, 117, or both to adevice under test or to apparatus for testing the device under test suchas a customized nest plate. Alternatively, the inner enclosure caninclude other apertures for passing electrical connections to a deviceunder test or testing apparatus. Element 105 represents a portion of therear metallic plate folded over onto the outside surface of the rearplate in order to help create aperture 103.

Outer Enclosure and Mounting of Inner Enclosure

FIG. 12 illustrates additional detail of upper outer enclosure 14through removal of cover 16. Upper outer enclosure 14 may include theremovable cover for additional access to the inside of test device 10.Alternatively, upper outer enclosure 14 may be composed of a one-piecemetallic material. As shown, portion 18 includes a channel 101 aroundthe entire periphery and included within channel 101 is an RF gasket 100that typically extends throughout the entire channel to provide forelectrical conductivity between portion 18 and cover 16 to simulate awelded seam for RF shielding. Instead of using RF gasket 100, removablecover 16 could include a lip extending the periphery of its undersideand fitting within channel 101 for conductivity. Portion 18 may includea bracket 102 for additional reinforcement and stability. Cover 16 maybe mounted on portion 18 through screws or other fasteners that engage aplurality of apertures such as aperture 104. Bracket 102 may be formedfrom the same material as portion 18 and as a part of it. FIG. 12 alsoillustrates the plurality of fasteners, such as metal fasteners 106 and108, which include corresponding screws 107 and 109 for attachment tomounting points within lower outer enclosure 12 as further explainedbelow.

FIG. 13 is a diagram further illustrating detail of lower innerenclosure 66 including plate 70 and RF absorption material 72. Together,plate 70 with absorption material 72 constitutes a base plate for use inaccommodating a nest plate containing a device under test. Since thebase plate includes a flat top surface, typically with threaded holes instandard locations, it provides a convenient platform for attaching manydifferent types or configurations of nest plates for potentially testingmany types or configurations of devices under test. A nest plate may beattached to the base plate, for example, using screws or other fastenersattached to the threaded holes. Also, as shown in FIG. 13, the transferplate includes connector elements 111 that attach to connectors 60 thatprovide for connection to a device under test or testing apparatus onthe inside of test device 10. The transfer plate would also include onits interior a connector element attached to connector 61. FIG. 13further illustrates receptacle 110 of gas spring 21; receptacle 110snaps onto a metal ball similar to element 25 but on the opposite sideof upper outer enclosure 14.

FIG. 14 is a diagram illustrating additional detail of the inside oflower outer enclosure 12 with the inner enclosure completely removed forillustrative purposes. As shown, the indented portions cast into lowerouter enclosure 12 provide for mounting points, such as points 112 and113. A plurality of threaded portions such as screws 107 and 109 wouldconnect with similar mounting points on the inside of lower outerenclosure 12 opposite mounting points 112 and 113. Therefore, in thisexample, lower inner enclosure 66 includes four fasteners, similar tofasteners 106 and 108, connected to four mounting points provided byfour indented portions in lower outer enclosure 12 for attachment oflower inner enclosure 66.

Use of the RF Isolation Test Device

Test device 10 has many potential uses in testing of wireless or otherdevices requiring or benefitting from RF shielding during the testing.For testing, a user typically mounts a nest plate to the base plate andmakes any required electrical connections, and the nest plate isconfigured to nest a particular type of device under test. The userplaces the device under test on the nest plate, closes test device 10,and performs a test of the device under test using external testingapparatus connected to the electrical connections. Following the test,the user may open test device 10, remove the device under test, placeanother similar device under test on the nest plate, close test device10, and repeat the testing process. Therefore, use of test device 10allows a user to quickly test similar devices, such as the same type ormodel of cellular telephone. In use, the test device is closed as shownin FIG. 1 and open as shown in FIG. 7.

For testing different types of devices, the user may remove the nestplate and mount another nest plate to the base plate. The other nestplate may be pre-configured for testing another type of device. Thetesting process can then be repeated with suitable electricalconnections made to the nest plate or testing apparatus. The user mayalso change the transfer plate if different electrical connections areto be used for testing.

While the present invention has been described in connection with anexemplary embodiment, it will be understood that many modifications willbe readily apparent to those skilled in the art, and this application isintended to cover any adaptations or variations thereof. For example,various configurations of the outer and inner enclosures and varioustypes of shielding and other materials may be used without departingfrom the scope of the invention. This invention should be limited onlyby the claims and equivalents thereof.

What is claimed is:
 1. A radio frequency (RF) isolation test device forshielding a device under test from RF energy, comprising: an upper outerenclosure; a lower outer enclosure mating with the upper outerenclosure, the upper and lower outer enclosures providing for RFshielding of a device under test located within the test device when theupper and lower outer enclosures are mated together; an RF absorptionmaterial located within the test device and at least partiallysurrounding the device under test when the upper and lower outerenclosures are mated together; and an open-close mechanism permittingthe upper and lower outer enclosures to open for access within the testdevice and to close for testing of the device under test, the open-closemechanism including an assist mechanism that assists a user in openingand closing the test device.
 2. The test device of claim 1 wherein theopen-close mechanism includes: a hinge fastened to a first side of theupper and lower outer enclosures; a handle fastened to a second side,opposite the first side, of the upper outer enclosure; and an elementlocated on a second side, opposite the first side, of the lower outerenclosure for engaging the handle when the test device is closed.
 3. Thetest device of claim 2 wherein the handle includes a hook for engagingthe element.
 4. The test device of claim 3 wherein the handle isconfigured to apply pressure between the upper and lower outerenclosures when the hook engages the element.
 5. The test device ofclaim 2 wherein the handle is configured to pivot in a first directionto open the test device and in a second direction to lock the upper andlower outer enclosures together.
 6. The test device of claim 1 whereinthe upper and lower outer enclosures are composed of a metallicmaterial.
 7. The test device of claim 1 wherein the assist mechanismincludes a pair of gas springs fastened to opposing sides of the upperand lower outer enclosures.
 8. The test device of claim 7 wherein thegas springs operate to maintain the test device open.
 9. The test deviceof claim 7 wherein the gas springs operate to separate the upper andlower outer enclosures from the closed position to the open position.10. The test device of claim 2 wherein the element includes a pin forengaging the hook.
 11. A radio frequency (RF) isolation test device forshielding a device under test from RF energy, comprising: an upper outerenclosure; a lower outer enclosure mating with the upper outerenclosure, the upper and lower outer enclosures providing for RFshielding of a device under test located within the test device when theupper and lower outer enclosures are mated together; an RF absorptionmaterial located within the test device and at least partiallysurrounding the device under test when the upper and lower outerenclosures are mated together; and a handle and a corresponding lockingelement, operably attached to the upper and lower outer enclosures, foruse in opening the upper and lower outer enclosures and for lockingclosed the upper and lower outer enclosures in order to test the deviceunder test located within the test device.
 12. The test device of claim11 wherein the locking element includes a pair of pins located on thelower outer enclosure.
 13. The test device of claim 11, furtherincluding a hinge fastened to a first side of the upper and lower outerenclosures.
 14. The test device of claim 12 wherein the handle includesa pair of hooks for engaging the pair of pins.
 15. The test device ofclaim 14 wherein the handle is configured to apply pressure between theupper and lower outer enclosures when the pair of hooks engages the pairof pins.
 16. The test device of claim 11 wherein the handle isconfigured to pivot in a first direction to open the test device and ina second direction to lock the upper and lower outer enclosurestogether.
 17. The test device of claim 11 wherein the upper and lowerouter enclosures are composed of a metallic material.
 18. The testdevice of claim 11, further including a pair of gas springs fastened toopposing sides of the upper and lower outer enclosures.
 19. The testdevice of claim 18 wherein the gas springs operate to maintain the testdevice open.
 20. The test device of claim 18 wherein the gas springsoperate to separate the upper and lower outer enclosures from the closedposition to the open position when the handle disengages the lockingelement.